Track sensitivity and the surface roughness measurements of CR-39 with atomic force microscope

Radiation Measurements

Volumn 31, Issue 1, 1999, Pages 203-208

  Yasuda, N ^a   Yamamoto, M ^a   Amemiya, K ^b   Takahashi, H ^b   Kyan, A ^c   Ogura, K ^d  

^a NATIONAL INSTITUTE OF RADIOLOGICAL SCIENCES   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c IBARAKI UNIVERSITY   (Japan)

^d NIHON UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COPOLYMERS; CORRELATION METHODS; ETCHING; PARTICLE BEAM TRACKING; SURFACE ROUGHNESS;

TRACK DETECTOR; TRACK SENSITIVITY;

PARTICLE DETECTORS;

EID: 0032590732     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4487(99)00089-X     Document Type: Article

References (3)

1. Ogura K, Hattori T, Asano M, Yoshida M, Omichi H, Nagaoka N, Kubota H, Katakai R and Hasegawa H (1997) Proton response of high sensitivity CR-39 copolymer. Radiat. Meas. 28, 197-200.
2. Yamamoto M, Yasuda N, Kaizuka Y, Yamagishi M, Kanai T, Ishigure N, Furukawa A, Kurano M, Miyahara N, Nakazawa M, Doke T and Ogura K (1997) Sensitivity analysis on heavy ion beam with atomic force microscope. Radiat. Meas. 28, 227-230.
3. Yasuda N, Yamamoto M, Miyahara N, Ishigure N, Kanai T and Ogura K (1998) Measurement of bulk etch rate of CR-39 with atomic force microscopy. Nucl. Instrum. and Meth. B142(1998) 111-116.