CMOS smart sensor for monitoring the quality of perishables

IEEE Journal of Solid-State Circuits

Volumn 42, Issue 4, 2007, Pages 798-803

  Ueno, Ken ^a,b   Hirose, Tetsuya ^a,b   Asai, Tetsuya ^a,b   Amemiya, Yoshihito ^b  

^a IEEE   (Japan)

^b HOKKAIDO UNIVERSITY   (Japan)

Author keywords

CMOS; Perishable; Quality guarantee; Smart sensor; Subthreshold current; Translinear

Indexed keywords

DISTRIBUTION PROCESS; MARINE PRODUCTS; QUALITY GUARANTEE; SUBTHRESHOLD CURRENTS;

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; ELECTRIC POWER UTILIZATION; MOSFET DEVICES; QUALITY ASSURANCE;

SMART SENSORS;

EID: 33947670505     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2007.891676     Document Type: Article

References (9)

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