Interface dependent magnetic moments in Cu/Co,Ni/Cu/Si(0 0 1) epitaxial structures

Journal of Magnetism and Magnetic Materials

Volumn 313, Issue 1, 2007, Pages 89-97

  Vaz, C A F ^a   Lauhoff, G ^a   Bland, J A C ^a   Langridge, S ^b   Bucknall, D G ^b   Penfold, J ^b   Clarke, J ^c   Halder, S K ^c   Tanner, B K ^c  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^c DURHAM UNIVERSITY   (United Kingdom)

Author keywords

Co; Grazing incidence X ray scattering; Magnetic moment; Ni; Polarised neutron reflection

Indexed keywords

COBALT; FILM GROWTH; INTERFACES (MATERIALS); MAGNETIC MOMENTS; NEUTRON REFLECTION; NICKEL; X RAY SCATTERING;

GRAZING INCIDENCE X-RAY SCATTERING; POLARISED NEUTRON REFLECTION (PNR); STRUCTURAL CHARACTERIZATION; WAVEVECTORS;

EPITAXIAL LAYERS;

EID: 33947670017     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2006.12.008     Document Type: Article

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