Electric field effects on magnetotransport properties of multiferroic Py/YMnO3/Pt heterostructures

Philosophical Magazine Letters

Volumn 87, Issue 3-4, 2007, Pages 183-191

  Laukhin, V ^a,b   Marti X ^a   Skumryev, V ^b,c   Hrabovsky, D ^a   Sanchez F ^a   Garcia Cuenca M V ^d   Ferrater, C ^d   Varela, M ^d   Luders U ^e   Bobo, J F ^e   Fontcuberta, J ^a  

^a CSIC   (Spain)

^b INSTITUCIÓ CATALANA DE RECERCA I ESTUDIS AVANÇATS ICREA   (Spain)

^c UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

^d UNIVERSITY OF BARCELONA   (Spain)

^e ONERA   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRODES; FERROELECTRIC MATERIALS; GALVANOMAGNETIC EFFECTS; LEAKAGE CURRENTS; MAGNETORESISTANCE;

EXCHANGE BIAS FIELD; MAGNETORESISTANCE MEASUREMENTS; METALLIC ELECTRODE (PT); SOFT FERROMAGNETIC LAYER (PY);

EPITAXIAL FILMS;

EID: 33947666011     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/09500830701210011     Document Type: Article

References (13)

1. N. Hur, S. Park, J.S. Ahn, et al., Nature 429 392 (2004).
2. Ch. Binek and B. Doudin, J. Phys.: Conds. Matter 17 L39 (2005);
3. Ch. Binek, A. Hochstrat, X. Chen, et al., J. Appl. Phys. 97 10C514 (2005).
4. M. Fiebig, J. Phys. D 38 R123 (2005);
5. Fiebig, Th. Lottermoser, D. Fröhlich, et al., Nature 419 818 (2002).
6. P. Borisov, A. Hochstrat, X. Chen, et al., Phys. Rev. Lett. 94 117203 (2005).
7. X. Martí, F. Sánchez, D. Hrabovsky, et al., Appl. Phys. Lett. 89 032510 (2006).
8. V. Laukhin, V. Skumryev, X. Marti, et al., Phys. Rev. Lett. 97 227201 (2006).
9. B.H. Miller and E. Dan Dahlberg, Appl. Phys. Lett. 69 3932 (1996);
10. H.L. Brown, E. Dan Dahlberg, M. Kief, et al., J. Appl. Phys. 91 7415 (2002).
11. X. Marti, F. Sánchez, D. Hrabovsky, et al., J. Cryst. Growth (2007), in press.
12. T. Gredig, I.N. Krivorotov and E. Dan Dahlberg, Phys. Rev. B 74 094431 (2006);
13. J.K. Kim, S.W. Kim, K.A. Lee, et al., J. Appl. Phys. 93 7714 (2003).