Statistical linearity calibration of time-to-digital converters using a free-running ring oscillator

Proceedings of the Asian Test Symposium

Volumn 2006, Issue , 2006, Pages 45-50

  Rivoir, Jochen ^a  

^a Verigy Germany GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DISTRIBUTED TIME EVENTS; STATISTICAL CODE DENSITY; TIME-TO-DIGITAL CONVERTERS (TDC);

ANALOG TO DIGITAL CONVERSION; CALIBRATION; CMOS INTEGRATED CIRCUITS; RANDOM PROCESSES; TIME VARYING SYSTEMS;

OSCILLATORS (ELECTRONIC);

EID: 33947615213     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2006.260991     Document Type: Conference Paper

References (8)

1. Jochen Rivoir, "Fully-Digital Time-to-Digital Converter for ATE with Autonomous Calibration", submitted to IEEE International Test Conference 2006
2. P. Dudek, S. Szczepa ski, J.V.Hatfield, "A High-Resolution CMOS Time-to-Digital Converter Utilizing a Vernier Delay Line", IEEE Transactions on Solid-State Circuits, Vol. 35, No. 2, February 2000, pp. 240-247
3. V. Gutnik, A. Chandrakasan, "On-chip picosecond time measurement", IEEE VLSI Circuits Digest of Technical Papers, 2000, pp. 52-53
4. P.M. Levine, G.W. Roberts, "A High-Resolution Flash Time-to-Digital Converter and Calibration Scheme", IEEE International Test Conference, 2004, pp. 1148-1157
5. A. Hajimiri, T.H. Lee, "The Design of Low Noise Oscillators", Kluwer Academic Publishers, 2002
6. R. Lidl, G. Pilz, "Applied Abstract Algebra", Springer, New York, 1984
7. "Euler's totient function", www.wikipedia.com
8. "Riemann zeta function", www.wikipedia.com