Exploiting gate leakage in deep-submicrometer CMOS for input offset adaptation

IEEE Transactions on Circuits and Systems II: Express Briefs

Volumn 54, Issue 2, 2007, Pages 127-130

  Hafliger P ^a   Berge, H K O ^a  

^a UNIVERSITY OF OSLO   (Norway)

Author keywords

Adaptation; deep submicrometer; gate leakage; offset cancellation

Indexed keywords

ADAPTIVE FILTERING; GATES (TRANSISTOR); HIGH PASS FILTERS; MICROMETERS; SEMICONDUCTOR DEVICE STRUCTURES;

GATE LEAKAGE; GATE-OXIDE STRUCTURE; OFFSET CANCELLATION;

CMOS INTEGRATED CIRCUITS;

EID: 33947609194     PISSN: 15497747     EISSN: 15583791     Source Type: Journal    
DOI: 10.1109/TCSII.2006.886241     Document Type: Article

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