Creep in protective α- Al2 O3 thermally grown on Β-NiAl

Applied Physics Letters

Volumn 90, Issue 12, 2007, Pages

  Veal, B W ^a   Paulikas, A P ^a   Hou, P Y ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CREEP RESISTANCE; SINGLE CRYSTALS; STOICHIOMETRY; STRAIN RELAXATION; THERMAL EFFECTS; X RAY DIFFRACTION;

CREEP RATES; CREEP RELAXATION; TEMPERATURE CHANGE; THERMALLY GROWTH;

CRYSTAL GROWTH;

EID: 33947605179     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2715105     Document Type: Article

References (17)

1. P. F. Tortorelli, K. L. More, E. D. Specht, B. A. Pint, and P. Zschack, Mater. High. Temp. 20, 303 (2003).
2. E. D. Specht, P. F. Tortorelli, and P. Zschack, Powder Diffr. 19, 68 (2004).
3. P. Y. Hou, A. P. Paulikas, and B. W. Veal, Mater. Sci. Forum 522-523, 433 (2006).
4. P. Y. Hou, A. P. Paulikas, and B. W. Veal, Mater. High. Temp. 22, 373 (2006).
5. B. W. Veal, A. P. Paulikas, and P. Y. Hou, Nat. Mater. 5, 349 (2006).
6. B. W. Veal, A. P. Paulikas, and R. C. Birtcher, Appl. Phys. Lett. 89, 161916 (2006).
7. W. R. Cannon and T. G. Langdon, J. Mater. Sci. 18, 1 (1983).
8. J. Cho, C. M. Wang, H. M. Chan, J. M. Rickman, and M. P. Harmer, J. Mater. Res. 16, 425 (2001).
9. H. Yoshida, Y. Ikuhara, and T. Sakuma, J. Mater. Res. 13, 2597 (1998).
10. F. Wakai, T. Nagano, and T. Iga, J. Am. Ceram. Soc. 80, 2361 (1997).
11. L. Xue and I.-W. Chen, J. Am. Ceram. Soc. 73, 3518 (1990).
12. R. M. Cannon, W. H. Rhodes, and A. H. Heuer, J. Am. Ceram. Soc. 63, 46 (1980).
13. A. G. Evans, D. R. Mumm, J. W. Hutchinson, G. H. Meier, and F. S. Pettit, Prog. Mater. Sci. 46, 505 (2001).
14. B. A. Pint, Oxid. Met. 45, 1 (1996).
15. H. E. Evans and A.-M. Huntz, Mater. High. Temp. 12, 111 (1994).
16. S. V. Raj, Mater. Sci. Eng., A 356, 283 (2003).
17. J. D. Whittenberger, J. Mater. Sci. 23, 235 (1988).