Generalized discrete software reliability modeling with effect of program size

IEEE Transactions on Systems, Man, and Cybernetics Part A:Systems and Humans

Volumn 37, Issue 2, 2007, Pages 170-179

  Inoue, Shinji ^a   Yamada, Shigeru ^a  

^a TOTTORI UNIVERSITY   (Japan)

Author keywords

Assessment measures; Binomial process; Discrete Weibull distribution; Generalized discrete model; Optimal release problems; Software reliability

Indexed keywords

COMPUTER SIMULATION; CONTINUOUS TIME SYSTEMS; FAILURE ANALYSIS; FAULT TOLERANT COMPUTER SYSTEMS; GEOMETRY; WEIBULL DISTRIBUTION;

ASSESSMENT MEASURES; BINOMIAL PROCESS; CONTINUOUS-TIME SOFTWARE REIABILITY GROWTH MODELING; DISCRETE WEIBULL DISTRIBUTION; GENERALIZED DISCRETE MODEL; OPTIMAL RELEASE PROBLEMS; SOFTWARE RELIABILITY GROWTH MODELS (SRGM);

SOFTWARE RELIABILITY;

EID: 33947584830     PISSN: 10834427     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSMCA.2006.889475     Document Type: Article

References (27)

1. S. Yamada and S. Osaki, "Software reliability growth modeling: Models and applications," IEEE Trans. Softw. Eng., vol. SE-11, no. 12, pp. 1431-1437, Dec. 1985.
2. J. D. Musa, D. Iannio, and K. Okumoto, Software Reliability: Measurement, Prediction, Application. New York: McGraw-Hill, 1987.
3. H. Pham, Software Reliability. Singapore: Springer-Verlag, 2000.
4. S. Yamada, "Software reliability models," in Stochastic Models in Reliability and Maintenance, S. Osaki, Ed. Berlin, Germany: Springer-Verlag, 2002, pp. 253-280.
5. N. Langberg and N. D. Singpurwalla, "A unification of some software reliability models," SIAM J. Sci. Stat. Comput., vol. 6, no. 3, pp. 781-790, 1985.
6. T. Dohi, T. Matsuoka, and S. Osaki, "An infinite server queueing model for assessment of the software reliability," Electron. Commun. Jpn., vol. 85, no. 3, pp. 536-544, 2000.
7. J. G. Shanthikumar, "A general software reliability model for performance prediction," Microelectron. Reliab., vol. 21, no. 5, pp. 671-682, 1981.
8. M. Kimura, S. Yamada, H. Tanaka, and S. Osaki, "Software reliability measurement with prior-information on initial fault content," Trans. Inf. Process. Soc. Jpn., vol. 34, no. 7, pp. 1601-1609, 1993.
9. A. Fries and A. Sen, "A survey of discrete reliability-growth models," IEEE Trans. Rel., vol. 45, no. 4, pp. 582-604, Dec. 1996.
10. S. Yamada and S. Osaki, "Discrete software reliability growth models," Appl. Stoch. Models Data Anal., vol. 1, no. 1, pp. 65-77, 1985.
11. C. Y. Huang, M. R. Lyu, and S. Y. Kuo, "A unified scheme of some non-homogeneous Poisson process models for software reliability estimation," IEEE Trans. Softw. Eng., vol. 29, no. 3, pp. 261-269, Mar. 2003.
12. H. Okamura, A. Murayama, and T. Dohi, "EM algorithm for discrete software reliability models: A unified parameter estimation method," in Proc. 8th IEEE Int. Symp. HASE, 2004, pp. 219-228.
13. T. Nakagawa and S. Osaki, "the discrete Weibull distribution," IEEE Trans. Rel., vol. R-24, no. 5, pp. 300-301, Dec. 1975.
14. J. D. Kalbfleisch and R. L. Prentice, The Statistical Analysis of Failure Time Data, 2nd ed. Hoboken, NJ: Wiley, 2002.
15. S. Inoue and S. Yamada, "Testing-coverage dependent software reliability growth modeling," Int. J. Reliab. Qual. Saf. Eng., vol. 11, no. 4, pp. 303-312, 2004.
16. S. Osaki, Applied Stochastic System Modeling. Berlin, Germany: Springer-Verlag, 1992.
17. S.M. Ross, Introduction to Probability Models, 6th ed. SanDiego, CA: Academic, 1997.
18. K. S. Trivedi, Probability and Statistics With Reliability, Queueing and Computer Science, 2nd ed. New York: Wiley, 2002.
19. D. Satoh, "A discrete Gompertz equation and a software reliability growth model," IEICE Trans. Inf. Syst., vol. E83-D, no. 7, pp. 1508-1513, 2000.
20. D. Satoh and S. Yamada, "Discrete equations and software reliability growth models," in Proc. 12th IEEE ISSRE, 2001, pp. 176-184.
21. D. Satoh and S. Yamada, "Parameter estimation of discrete logistic curve models for software reliability assessment," Jpn. J. Ind. Appl. Math., vol. 19, no. 1, pp. 39-54, 2002.
22. T. Fujiwara and S. Yamada, "A new testing-path coverage measure - Testing-domain metrics based on a software reliability growth model," in Proc. 13th IEEE ISSRE, 2002, pp. 71-75.
23. M. Ohba, "Software reliability analysis models," IBM J. Res. Develop., vol. 28, no. 4, pp. 428-443, 1984.
24. A. L. Goel, "Software reliability models: Assumptions, limitations, and applicability," IEEE Trans. Softw. Eng., vol. SE-11, no. 12, pp. 1411-1423, Dec. 1985.
25. W. D. Brooks and R. W. Motley, "Analysis of discrete software reliability models," Rome Air Develop. Center, New York, Tech. Rep. RADC-TR-80-84, 1980.
26. S. Inoue and S. Yamada, "NHPP modeling based on discrete statistical data analysis models for software reliability assessment," in Proc. Int. Workshop Rel. Appl., 2003, pp. 138-143.
27. S. Yamada and S. Osaki, "Cost-reliability optimal release policies for software systems," IEEE Trans. Rel., vol. R-34, no. 5, pp. 422-424, May 1985.