Residual stresses and texture in Ni/SiC nanocomposite coatings

Journal of Alloys and Compounds

Volumn 434-435, Issue SPEC. ISS., 2007, Pages 704-706

  Ari Gur, P ^a   Sariel, J ^b   Vemuganti, S ^a  

^a WESTERN MICHIGAN UNIVERSITY   (United States)

^b NUCLEAR RESEARCH CENTER NEGEV   (Israel)

Author keywords

Anisotropy; Crystal structure; Nanostructured materials; X ray diffraction

Indexed keywords

ANISOTROPY; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; RESIDUAL STRESSES; SILICON CARBIDE; X RAY DIFFRACTION ANALYSIS;

CRYSTALLOGRAPHIC TEXTURE; MICRO-COMPOSITES; NICKEL MATRIX;

NANOSTRUCTURED MATERIALS;

EID: 33947572285     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2006.08.285     Document Type: Article

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