Scanning tunneling microscopy/spectroscopy of heavily overdoped Bi 2Sr2CuOy single crystals

AIP Conference Proceedings

Volumn 850, Issue , 2006, Pages 509-510

  Mashima, Hideki ^a   Fukuo, Noritaka ^a   Kinoda, Go ^b   Hitosugi, Taro ^c   Shimada, Toshihiro ^c   Kondo, Takeshi ^d   Okada, Yoshinori ^d   Ikuta, Hiroshi ^d   Matsumoto, Yuji ^a   Hasegawa, Tetsuya ^c  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b KANAGAWA ACADEMY OF SCIENCE AND TECHNOLOGY   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

^d NAGOYA UNIVERSITY   (Japan)

Author keywords

Bi2201; Electronic inhomogeneity; Pseudogap; STM STS

Indexed keywords

EID: 33947507283     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2354808     Document Type: Conference Paper

References (5)

1. Ch. Renner et al., Phys. Rev. Lett. 80, 3606 (1998).
2. A. Matsuda et al., Phys. Rev. B 60,1377 (1999).
3. S. H. Pan et al., Nature 413, 282 (2001).
4. K. M. Lang et al., Nature 415, 412 (2002).
5. G. Kinoda et al., Phys. Rev. B 71, 020502 (2005).