Assembling ferromagnetic single-electron transistors by atomic force microscopy

Nanotechnology

Volumn 18, Issue 5, 2007, Pages

  Liu, R S ^a,b   Suyatin, D ^b   Pettersson, H ^a,b   Samuelson, L ^b  

^a HALMSTAD UNIVERSITY   (Sweden)

^b LUND UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COULOMB BLOCKADE; ELECTRODES; ELECTRON TUNNELING; FERROMAGNETIC MATERIALS; IMAGING TECHNIQUES; PLASMAS;

DRAIN ELECTRODES; PLASMA-OXIDIZED; SINGLE-ELECTRON TRANSISTORS; SPIN-DEPENDENT TUNNELLING;

TRANSISTORS;

FERROMAGNETIC MATERIAL; NICKEL;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRODE; PRIORITY JOURNAL; SEMICONDUCTOR; SINGLE ELECTRON TRANSISTOR;

EID: 33947491239     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/5/055302     Document Type: Article

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