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Volumn 882, Issue , 2007, Pages 764-766

An x-ray excited optical luminescence (XEOL) analysis of Mn2+ doped ZnS nanostructures

Author keywords

Doped semiconductor; Nanostructures; Synchrotron radiation; XEOL

Indexed keywords


EID: 33947418461     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2644657     Document Type: Conference Paper
Times cited : (3)

References (14)
  • 8
    • 22144495317 scopus 로고    scopus 로고
    • X-ray Excited Optical Luminescence Spectroscopies
    • edited by T.K. Sham, River Edge, NJ: World Scientific
    • A. Rogalev, J. Goulon, "X-ray Excited Optical Luminescence Spectroscopies," in Chemical Applications of Synchrotron Radiation, Part II: X-ray Applications, edited by T.K. Sham, River Edge, NJ: World Scientific, 2002, Vol. 12B, pp. 707-760.
    • (2002) Chemical Applications of Synchrotron Radiation, Part II: X-ray Applications , vol.12 B , pp. 707-760
    • Rogalev, A.1    Goulon, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.