Dedicated high-resolution powder diffraction beamline at the advanced photon source

AIP Conference Proceedings

Volumn 705, Issue , 2004, Pages 388-391

  Lee, Peter L ^a   Beno, Mark A ^a   Shu, Deming ^a   Ramanathan, Mohan ^a   Mitchell, John F ^b   Jorgensen, James D ^b   Von Dreele, Robert B ^a,b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85012271362     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1757815     Document Type: Conference Paper

References (9)

1. Levin, I., Vanderah, T. A., Coutts, R., and Bell, S. M., J. Mater. Res. 17, 1729 (2002).
2. Fridriksson, T., Bish, D. L., and Bird, D. K., Amer. Mineral., in press (2003).
3. Radaelli, P. G., Horibe, Y., Gutmann, M. J., Ishibashi, H., Chen, C. H., Ibberson, R. M., Koyama, Y., Hor, Y. S., Kiryukhin, V., Cheong, S. W., Nature 416, 155 (2002).
4. Yildrim, T., Gülseren, O., Lynn, J. W., Brown, C. M., Udovic, T. J., Huang, Q., Rogado, N., Regan, K. A., Hayward, M. A., Slusky, J. S., He, T., Haas, M. K., Khalifah, P., Inumaru, K., and Cava, R. J., Phys. Rev. Lett. 87, 037001 (2001).
5. Jorgensen, J. D., Hinks, D. G., and Short, S., Phys. Rev. B 63, 224522 (2001).
6. Y. Zhang, P. L. Lee, G. S. Nolas, and Wilkinson, A. P., Appl. Phys. Lett 80, 2931 (2002).
7. Pagola, S., Stephens, P. W., Bohle, D. S., Kosar, A. D., and Madsen, S. K., Nature 404, 307 (2000).
8. Shu, D., Preissner, C., Nocher, D., Han, Y., Barraza, J., Lee, P. L., Lee, W.-K., Cai, Z., Ginell, S., Alkire, R., Lazarski, K., Schuessler, R., and Joachimiak, A., Presenting in SRI 2003.
9. Fitch, A. N., BM-16 ESRF.