EXAFS and XRD studies with subpicometer accuracy: The case of ReO 3

AIP Conference Proceedings

Volumn 882, Issue , 2007, Pages 422-424

  Purans, Juris ^a   Dalba, Giuseppe ^a   Fornasini, Paolo ^a   Kuzmin, Alexei ^b   De Panfilis, Simone ^c   Rocca, Francesco ^d  

^a UNIVERSITY OF TRENTO   (Italy)

^b UNIVERSITY OF LATVIA   (Latvia)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d IFN CNR   (Italy)

Author keywords

Cumulants; EXAFS; Re03; Thermal expansion; XRD

Indexed keywords

EID: 33947383023     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2644546     Document Type: Conference Paper

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