Development of the soft X-ray intensity measurement with a cryogenic radiometer

AIP Conference Proceedings

Volumn 879, Issue , 2007, Pages 1129-1132

  Kato, M ^a   Nohtomi, A ^a   Morishita, Y ^a   Kurosawa, T ^a   Arai, N ^a   Suzuki, I H ^a   Saito, N ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Absolute intensity; Cryogenic radiometer; Primary standard; Soft X ray; Synchrotron radiation

Indexed keywords

EID: 33947379086     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2436262     Document Type: Conference Paper

References (11)

1. H. Saisho, Y. Gohshi, Applications of Synchrotron Radiation to Material Analysis, Elsevier Science, Amsterdam (1996)
2. H. Rabus, V. Persch, G. Ulm, Appl. Opt. 36, 5421 (1997)
3. L. R. Canfield. Appl. Opt. 26, 3831 (1987)
4. N. Saito and I. H. Suzuki, J. Electron. Spectrosc. Relat. Phenom. 101-103, 33 (1999)
5. Y. Morishita, N. Saito and I. H. Suzuki, J. Electron Spectrosc. Relat. Phenom. 144-147, 1071 (2005)
6. M. Funabashi, M. Nomura, Y. Kitajima, T. Yokoyama, T. Ohta and H. Kuroda, Rev. Scl. Instrum. 60, 1983 (1989)
7. T. Ohta, P. M. Stefan, M. Nomura and H. Sekiyama, Nucl. Instrum. Meyhods A 246, 373 (1986)
8. Y. Kitajima, J. Electron Spectrosc. Relat. Phenom. 80, 405 (1996)
9. M. Boutillon and A. M. Perroche-Roux, Phys. Med. Biol., 32, 213 (1987)
10. M. Breinig, M. H. Chen, G. E. Ice, F. Parente, B. Crasemann and G. S. Brown, Phys. Rev. A 22, 520 (1980)
11. N. Saito and I. H. Suzuki. Radiat. Res., 156, 317 (2001)