Absolute fluence rates of soft X-rays using a double ion chamber

Journal of Electron Spectroscopy and Related Phenomena

Volumn 101-103, Issue , 1999, Pages 33-37

  Saito, Norio ^a   Suzuki, Isao H ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

Absolute intensity measurement; Ion chamber; Soft X rays

Indexed keywords

EID: 0002948580     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(98)00468-x     Document Type: Article

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14. N. Saito, I.H. Suzuki, to be published.