Fork-coupled resonators for high-frequency characterization of dielectric substrate materials

IEEE Transactions on Instrumentation and Measurement

Volumn 55, Issue 6, 2006, Pages 2216-2220

  Muqaibel, Ali Hussein ^b   Safaai Jazi, Ahmad ^a,c   Riad, Sedki M ^a,c  

^a IEEE

^b KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS   (Saudi Arabia)

^c State University   (United States)

Author keywords

Coplanar waveguide components; Dielectric constant; Microwave materials; Microwave measurement; Permittivity measurement; Resonators; Substrates

Indexed keywords

COPLANAR WAVEGUIDES; MICROWAVE MEASUREMENT; NATURAL FREQUENCIES; PERMITTIVITY; PERMITTIVITY MEASUREMENT; SUBSTRATES;

COUPLING EFFICIENCY; DIELECTRIC CHARACTERIZATION; MICROSTRIP RESONATORS; MICROWAVE MATERIALS;

DIELECTRIC RESONATORS;

EID: 33947324982     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2006.884390     Document Type: Article

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