Correlation between structural defects and properties in large La-Sr-Mn-O single crystals

Journal of Applied Physics

Volumn 101, Issue 5, 2007, Pages

  Monot Laffez, Isabelle ^b,c   Dominiczak, Maguy ^a   Giovannelli, Fabien ^a   Ruyter, Antoine ^a   Rossell, Marta D ^d   Van Tendeloo, Gustaaf ^d  

^a CNRS   (France)

^b UNIVERSITÉ DE TOURS   (France)

^c UFR des Sciences et Techniques   (France)

^d UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; ELECTRIC PROPERTIES; LANTHANUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; STRONTIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

FLOATING ZONE TECHNIQUES; NANOCRACKS;

SINGLE CRYSTALS;

EID: 33947312837     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2710439     Document Type: Article

References (16)

1. T. Kimura, Y. Tomioka, A. Asamitsu, and Y. Tokura, Phys. Rev. Lett. 81, 5920 (1988).
2. M. Kubota, H. Fujioka, K. Hirota, K. Ohoyama, Y. Moritomo, H. Yoshizawa, and Y. Endoh, J. Phys. Soc. Jpn. 69, 1606 (2000).
3. D. I. J. Hurle and P. Rudolph, J. Cryst. Growth 264, 550 (2004).
4. A. Douy and P. Odier, Mater. Res. Bull. 24, 1119 (1989).
5. L. Pinsard, Ph.D. thesis, Universit́ Paris XI-Orsay, 1998.
6. D. Shulyatev, S. Karabashev, A. Arsenov, Ya. Mukovskii, and S. A. Zverkov, J. Cryst. Growth 237-239, 810 (2002).
7. A. M. Blabashov, S. G. Karabashev, Ya. Mukovskii, and S. A. Zverkov, J. Cryst. Growth 167, 365 (1996).
8. D. Prabhakaran, A. I. Coldea, A. T. Boothroyd, and S. J. Blundell, J. Cryst. Growth 237-239, 806 (2002).
9. C. N. R. Rao, R. Mahesh, A. K. Raychaudhuri, and R. Mahendiran, J. Phys. Chem. Solids 59, 497 (1998).
10. B. Dabrowski, Phys. Rev. B 60, 7006 (1999).
11. W. J. Lu, Y. P. Sun, X. B. Zhu, W. H. Song, and J. J. Du, Mater. Lett. 60, 3207 (2006).
12. M. Liebmann, A. Schwarz, U. Kaiser, R. Wiesendanger, D.-W. Kim, and T.-W. Noh, Phys. Rev. B 71, 104431 (2005).
13. Y. Wu, Y. Suzuki, U. Rdiger, J. Yu, A. D. Kent, T. K. Nath, and C. B. Eom, Appl. Phys. Lett. 75, 2295 (1999).
14. M. Hehn, S. Padovani, K. Ounadjela, and J. P. Bucher, Phys. Rev. B 54, 3428 (1996).
15. G. Bochi, H. J. Hug, D. I. Paul, B. Stiefel, A. Moser, I. Parashikov, H.-J. Güntherodt, R. C. O'Handley, Phys. Rev. Lett. 75, 1839 (1995).
16. T. H. Yang, S. L. Cheng, and L. J. Chen, Thin Solid Films 469-470, 513 (2004).