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Volumn 301-302, Issue SPEC. ISS., 2007, Pages 235-239
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Invalidity of graded buffers for InAs grown on GaAs (0 0 1)-A comparison between direct and graded-buffer growth
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Author keywords
A1. Line defects; A3. Graded buffers; A3. Lattice mismatched growth; A3. Molecular beam epitaxy; B2. InAs; B2. Semiconducting III V materials
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Indexed keywords
BUFFER LAYERS;
DISLOCATIONS (CRYSTALS);
MOLECULAR BEAM EPITAXY;
SEMICONDUCTING INDIUM COMPOUNDS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
GRADED BUFFERS;
LATTICE MISMATCHED GROWTH;
LINE DEFECTS;
PLAN-VIEW TRANSMISSION ELECTRON MICROSCOPY (PTEM);
EPITAXIAL GROWTH;
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EID: 33947311064
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2006.11.084 Document Type: Article |
Times cited : (28)
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References (12)
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