Molecular beam epitaxy growth, magnetic and structural properties of MnAs thin films grown on InP(0 0 1) and InGaAsP

Journal of Crystal Growth

Volumn 301-302, Issue SPEC. ISS., 2007, Pages 615-618

  Yokoyama, M ^a   Ohya, S ^a,b   Tanaka, M ^a,b  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

A1. Reflection high energy electron diffraction (RHEED); A1. X ray diffraction; A3. Molecular beam epitaxy; B1. MnAs; B2. Magnetic properties of monolayers and thin films; B3. Spintronics

Indexed keywords

CRYSTAL STRUCTURE; FERROMAGNETISM; MAGNETOELECTRONICS; MOLECULAR BEAM EPITAXY; SEMICONDUCTING MANGANESE COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

MAGNETIZATION AXIS; MONOLITHIC INTEGRATION; REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION (RHEED);

THIN FILMS;

EID: 33947305747     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.11.156     Document Type: Article

References (9)

1. Yokoyama M., Ohya S., and Tanaka M. Appl. Phys. Lett. 88 (2006) 012504
2. Amemiya T., Shimizu H., Nakano Y., Hai P.N., Yokoyama M., and Tanaka M. Appl. Phys. Lett. 89 (2006) 021104
3. Tanaka M. Semicond. Sci. Technol. 17 (2002) 327
4. Ploog K.H. J. Appl. Phys. 91 (2002) 7256
5. Tanaka M., Harbison J.P., Sands T., Cheeks T.L., Keramidas V.G., and Rothberg G.M. J. Vac. Sci. Technol. B 12 (1994) 1091
6. Tanaka M., Harbison J.P., Park M.C., Park Y.S., Shin T., and Rothberg G.M. Appl. Phys. Lett. 65 (1994) 1964
7. Massalski T.B., Okamoto H., Subramanian P.R., and Kacprzak L. Binary Alloy Phase Diagram vol. 1 (1986), Metallurgical Society, Warrendale, PA p. 293 and references therein
8. Mira J., Rivadulla F., Rivas J., Fondado A., Guidi T., Caciuffo R., Carsughi F., Radaelli P.G., and Goodenough J.B. Phys. Rev. Lett. 90 (2003) 097203
9. Nakane R., Sugahara S., and Tanaka M. J. Appl. Phys. 95 (2004) 6558