Gabor feature-based apple quality inspection using kernel principal component analysis

Journal of Food Engineering

Volumn 81, Issue 4, 2007, Pages 741-749

  Zhu, Bin ^a   Jiang, Lu ^a   Luo, Yaguang ^b   Tao, Yang ^a  

^a UNIVERSITY OF MARYLAND   (United States)

^b Produce Quality and Safety Laboratory   (United States)

Author keywords

Apple quality inspection; Gabor wavelet; Gabor based kernel PCA; Kernel PCA; Near infrared; Principal component analysis (PCA)

Indexed keywords

FRUITS; PRINCIPAL COMPONENT ANALYSIS; QUALITY CONTROL; STATISTICAL METHODS;

APPLE QUALITY INSPECTION; GABOR WAVELETS; NEAR-INFRARED (NIR) IMAGING;

WAVELET TRANSFORMS;

FRUITS; QUALITY CONTROL; STATISTICAL ANALYSIS;

MALUS X DOMESTICA;

EID: 33947268000     PISSN: 02608774     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jfoodeng.2007.01.008     Document Type: Article

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