Building a rule-based machine-vision system for defect inspection on apple sorting and packing lines

Expert Systems with Applications

Volumn 16, Issue 3, 1999, Pages 307-313

  Wen, Zhiqing ^a   Tao, Yang ^a  

^a 3202 Bell Engineering Center   (United States)

Author keywords

Calyx; Defect; Fruit; Imaging; Infrared; Inspection; Machine vision; Stem end

Indexed keywords

EID: 0347824124     PISSN: 09574174     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0957-4174(98)00079-7     Document Type: Article

References (13)

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