Molecular dynamic simulation study of AFM single-wall carbon nanotube tip-surface interactions

Key Engineering Materials

Volumn 339, Issue , 2007, Pages 206-210

  Liang, Y C ^a   Dou, J H ^a   Bai, Q S ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Atomic force microscope; Carbon nanotube; Molecular dynamic simulation

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; MOLECULAR DYNAMICS; NANOTIPS; SILICON; STRAIN MEASUREMENT;

CRITICAL STRAIN; DYNAMIC INTERACTIONS; STRAIN FORCE;

CARBON NANOTUBES;

EID: 33947213471     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/0-87849-430-8.206     Document Type: Conference Paper

References (8)

1. S. Iijima: Nature, Vol.354 (1991), pp.56.
2. B.I. Yakobson and et al: Computational Materials Science. Vol.8 (1997), pp.341-348.
3. Deepak Srivastava and et al: Phys. Rev. Lett., Vol.83 (1999), pp.2973.
4. Lawrence A. Wade and et al: Nano Letters, Vol.44 (2004), pp.725-731.
5. B.J. Alder and I.E. Wainwright: J. Chem. Phys., Vol.27 (1957). pp.1208-1218.
6. D.W. Brenner and et al: J. Phys. Condens. Matter, Vol.14 (2002), pp.783.
7. A.J. Dyson and et al: Molecular Physics, Vol.96 (1999), pp.1491-1507.
8. Q. Dong, K.L. Wang. Rodney and S. Ruoff: J. Phys. Chem, B, Vol.105 (2001), pp.10753-10758.