Three-dimensional slit width measurement for long precision slot dies

Key Engineering Materials

Volumn 295-296, Issue , 2005, Pages 343-348

  Furukawa, M ^a   Gao, W ^a   Shimizu, H ^a   Kiyono, S ^a   Yasutake, M ^b   Takahashi, K ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b Ryotec Corporation   (Japan)

Author keywords

2 point method; 3D; Flatness; Measurement; Scanning; Slit width; Slot die

Indexed keywords

LASER APPLICATIONS; PROBES; QUALITY CONTROL; SENSORS; THREE DIMENSIONAL;

LASER PROBES; REPEATABILITY ERROR; SLIT WIDTH;

SURFACE MEASUREMENT;

EID: 33947175589     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/0-87849-977-6.343     Document Type: Article

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