Hydrogen-induced stress relaxation in thin pd films: Influence of carbon implementation

Langmuir

Volumn 23, Issue 4, 2007, Pages 1752-1758

  Nowakowski, Robert ^a   Grzeszczak, Patrycja ^a   Dus, Ryszard ^a  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON; HYDROGEN; IMPURITIES; LATTICE CONSTANTS; PALLADIUM; STRESS RELAXATION;

CARBON ATOMS; CARBON IMPURITY; FILM SURFACE; MESOSCOPIC PROTRUSIONS;

THIN FILMS;

EID: 33947109514     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la062179i     Document Type: Article

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