Microstructural analysis of ZnO/ZnS nanocables through Moiré fringe induced by overlapped area of ZnO and ZnS

Journal of Crystal Growth

Volumn 294, Issue 2, 2006, Pages 162-167

  Sun, C W ^b   Jeong, J S ^a   Lee, J Y ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b NONE

Author keywords

A1. Heterostructure; A2. Moir fringes; A3. Thermal vapor transport method; B1. ZnO ZnS nanocable

Indexed keywords

DEFECT STRUCTURES; HETEROJUNCTIONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INTERFACES (MATERIALS); STACKING FAULTS;

SPHALERITE; THERMAL VAPOR TRANSPORT METHOD; ZNO/ZNS NANOCABLE;

NANOSTRUCTURED MATERIALS;

EID: 33947100448     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.06.023     Document Type: Article

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