Choice of insulating layer for YBCO in a multilayer architecture on buffered RABiTS

Superconductor Science and Technology

Volumn 20, Issue 3, 2007, Pages 216-221

  Cheung, Y L ^a   Jones, I P ^a   Abell, J S ^a   Button, T W ^a   Maher, E F ^b  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^b Coated Conductors Cylinders Ltd ^*  (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; GRAIN BOUNDARIES; MOLECULAR ORBITALS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR INSULATOR BOUNDARIES; SURFACE MORPHOLOGY;

INSULATING LAYERS; MICROTEXTURAL ANALYSIS; MULTILAYER ARCHITECTURE; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM);

YTTRIUM BARIUM COPPER OXIDES;

EID: 33847782767     PISSN: 09532048     EISSN: 13616668     Source Type: Journal    
DOI: 10.1088/0953-2048/20/3/017     Document Type: Article

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