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Volumn 488, Issue 1-2, 2005, Pages 217-222

Microstructure and current transport properties of single-layer YBa 2Cu3O7-x and multiple-layer YBa 2Cu3O7-x/(Ba0.05, Sr 0.95)TiO3 superconductor films

(4) Luo, Y a Hughes, R A b Preston, J S a,b Botton, G A a,b

a MCMASTER UNIVERSITY (Canada)

b MCMASTER UNIVERSITY (Canada)

Author keywords

Multiple layer films; Superconductivity; TEM

Indexed keywords

CURRENT DENSITY; DEGRADATION; GRAIN BOUNDARIES; MICROSTRUCTURE; MICROWAVE DEVICES; PULSED LASER DEPOSITION; SUPERCONDUCTING WIRE; SUPERCONDUCTIVITY; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY;

MOIRE TECHNIQUE; MULTIPLE-LAYER FILMS; NANO-COMPOSITE FILMS; SINGLE-LAYER FILMS;

SUPERCONDUCTING FILMS;

EID: 23044440256 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2005.04.003 Document Type: Article

Times cited : (4)

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