Integrated a-Si TFT row driver circuits for high-resolution applications

Journal of the Society for Information Display

Volumn 14, Issue 4, 2006, Pages 333-337

  Kim, Cheon Hong ^a   Yoo, Se Jong ^a   Kim, Hyun Jin ^a   Jun, Jung Mok ^a   Lee, Jung Yeal ^a  

^a BOE HYDIS Technology Co Ltd   (South Korea)

Author keywords

A Si TFT; Advanced FFS; Reliability; Row driver; Shift register

Indexed keywords

AUTOMOBILE DRIVERS; METEOROLOGY; MOISTURE; NETWORKS (CIRCUITS); SHIFT REGISTERS; SILICON;

A-SI TFT; ADVANCED FFS; AMORPHOUS; CIRCUIT PARAMETERS; CIRCUIT STRUCTURES; DRIVER CIRCUITS; FIELD SWITCHING; HIGH-RESOLUTION; PHASE CLOCKS; REGISTER CIRCUITS; RELIABLE; ROW DRIVER; TEST RESULTS; TFT PROCESSES;

AMORPHOUS SILICON;

EID: 33847746845     PISSN: 10710922     EISSN: None     Source Type: Journal    
DOI: 10.1889/1.2196508     Document Type: Article

References (9)

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