Influence of the photoinduced focal length of a thin nonlinear material in the Z-scan technique

Optics Express

Volumn 15, Issue 5, 2007, Pages 2517-2529

  Lara, Edmundo Reynoso ^a   Meza, Zulema Navarrete ^a   Iturbe Castillo, M David ^a   Palacios, Carlos G Treviño ^a   Panameño, Erwín Martí ^b   Carrasco, M Luis Arroyo ^b  

^a INSTITUTO NACIONAL DE ASTROFÍSICA   (Mexico)

^b BENEMÉRITA UNIVERSIDAD AUTÓNOMA DE PUEBLA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CURVE FITTING; ELECTRIC DISTORTION; ELECTRIC EXCITATION; GAUSSIAN BEAMS; INTEGER PROGRAMMING; LIGHT PROPAGATION; NONLINEAR OPTICS; RAYLEIGH SCATTERING;

FUNCTIONAL DEPENDENCE; PHOTOINDUCED LENS; Z-SCAN TECHNIQUE;

MEMS;

EID: 33847723892     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.002517     Document Type: Article

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