Determinations of third- and fifth-order nonlinearities by the use of the top-hat-beam Z scan: Theory and experiment

Journal of the Optical Society of America B: Optical Physics

Volumn 22, Issue 2, 2005, Pages 446-452

  Gu, Bing ^a,b   Peng, Xian Chu ^a   Jia, Tao ^a   Ding, Jian Ping ^a   He, Jing Liang ^a   Wang, Hui Tian ^a  

^a NANJING UNIVERSITY   (China)

^b NANJING NORMAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT REFRACTION; NUMERICAL ANALYSIS; OPTICAL MATERIALS; OPTICAL PROPERTIES;

NONLINEAR REFRACTION; OPTICAL NONLINEARITY; TOP-HAT-BEAM Z SCAN TECHNIQUE;

NONLINEAR OPTICS;

EID: 15044350053     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.22.000446     Document Type: Article

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