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Volumn 98, Issue 9, 2007, Pages

Intrinsic noise properties of atomic point contact displacement detectors

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVES; NATURAL FREQUENCIES; POINT CONTACTS; SIGNAL NOISE MEASUREMENT;

EID: 33847677692     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.98.096804     Document Type: Article
Times cited : (70)

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