Compact electrostatic levitator for diffraction measurements with a two axis diffractometer and a laboratory x-ray source

Review of Scientific Instruments

Volumn 78, Issue 2, 2007, Pages

  Masaki, Tadahiko ^a   Ishikawa, Takehiko ^a   Paradis, Paul Fraņois ^a   Yoda, Shinichi ^a   Okada, Junpei T ^b   Watanabe, Yasuhiro ^b   Nanao, Susumu ^b   Ishikura, Akiko ^c   Higuchi, Kensuke ^c   Mizuno, Akitoshi ^c   Watanabe, Masato ^c   Kohara, Shinji ^d  

^a JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c GAKUSHUIN UNIVERSITY   (Japan)

^d JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; DIFFRACTOMETERS; ELECTRON DIFFRACTION; STRUCTURAL ANALYSIS; SYNCHROTRON RADIATION; X RAYS;

ELECTROSTATIC LEVITATORS; LIQUID PHASES; STRUCTURAL MEASUREMENTS; X-RAY SOURCES;

ELECTRIC FIELD EFFECTS;

EID: 33847654205     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2435590     Document Type: Article

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