Variable Rowland radius laboratory vacuum surface-sensitive x-ray absorption fine structure spectrometer

Review of Scientific Instruments

Volumn 78, Issue 2, 2007, Pages

  Yuryev, Yu N ^a   Lee, Hwack Joo ^a   Park, Hyun Min ^a   Cho, Yang Koo ^a   Lee, Min Kyu ^a   Pogrebitsky, K Ju ^b  

^a Korea Research Institute of Standards and Science   (South Korea)

^b IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CRYSTALLINE MATERIALS; MONOCHROMATORS; PHOTONS; SENSITIVITY ANALYSIS; SURFACE PROPERTIES; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

ENERGY RESOLUTION; ROWLAND RADIUS; SURFACE SENSITIVITY;

X RAY SPECTROMETERS;

EID: 33847630404     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2669591     Document Type: Article

References (19)

1. X-ray Absorption, Principles, Applications, Techniques of EXAFS, SEXAFS and XANES, edited by, D. Koningsberger, and, R. Prins, (Wiley, New York, 1988).
2. R. G. Jones and D. P. Woodruff, Surf. Sci. 114, 38 (1982).
3. M. Kasrai, W. N. Lennard, R. W. Brunner, G. M. Bancroft, J. A. Bardwell, and K. H. Tan, Appl. Surf. Sci. 99, 303 (1996).
4. G. Martens, P. Rabe, G. Tolkiehn, and A. Werner, Phys. Status Solidi A 55, 105 (1979).
5. W. H. McMaster, N. K. D. Grande, J. H. Mallett, and J. H. Hubbell, Lawrence Livermore National Laboratory Report No. UCRL-50174, 1970 (unpublished); online available at http://www.csrri.iit.edu/periodic-table.html.
6. H. Winick, AIP Conf. Proc. 184, 2138 (1989).
7. Handbook on Synchrotron Radiation, edited by, E.-E. Koch, (North-Holland, Amsterdam, 1983), Vol. 1A.
8. A. Williams, Rev. Sci. Instrum. 54, 193 (1983).
9. W. Thulke, R. Haenset, and P. Rabe, Rev. Sci. Instrum. 54, 277 (1983).
10. G. Cohen, D. Fisher, J. Colbert, and N. Shevchik, Rev. Sci. Instrum. 51, 273 (1980).
11. P. Georgopoulos and G. Knapp, J. Appl. Crystallogr. 14, 3 (1981).
12. S. Song, J. Kim, J. Lee, J. Choi, K. Pogrebitsky, L. Bakaleikov, Y. Yuryev, and O. Usov, Proceedings of the International Centennial Symposium on the Electron, 1997 (unpublished), pp. 557-565.
13. L. Bakaleinikov, S. G. Konnikov, K. Ju. Pogrebitsky, Yu. N. Yuryev, A. A. Vereninov, R. Svagera, R. Kaitna, and G. Barnegg-Golwig, Adv. X-Ray Anal. 35, 1243 (1992).
14. M. A. Blokhin, in Advances in X-Ray Spectroscopy: Contributions in Honour of Professor Y. Cauchois, edited by, C. Bonnelle, and, C. Mande, (Pergamon, New York, 1982), pp. 90-103.
15. D. Koningsberger, X-ray Absorption, Principles, Applications, Techniques of EXAFS, SEXAFS and XANES (Ref.), Chap., pp. 163-210.
16. P. A. Lee, Phys. Rev. B 13, 5261 (1976).
17. S. Zabinsky, J. Rehr, A. Ankudiniv, R. Albers, and M. Eller, Phys. Rev. B 52, 2995 (1995).
18. B. Ravel and M. Newville, J. Synchrotron Radiat. 12, 537 (2005).
19. R. E. Hann and P. R. S. J. L. Pentecost, J. Am. Ceram. Soc. 68, C285 (1985).