Deep level transient spectroscopy of SnO2-based varistors

Applied Physics Letters

Volumn 90, Issue 9, 2007, Pages

  Fan, Jiwei ^a   Freer, Robert ^b  

^a ZHONGYUAN UNIVERSITY OF TECHNOLOGY   (China)

^b UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRON TRAPS; ELECTRONIC STATES; IONIZATION POTENTIAL; NIOBIUM COMPOUNDS; OXYGEN VACANCIES; TIN DIOXIDE;

DONOR DENSITY; LATTICE SITE; TRAP DENSITY;

VARISTORS;

EID: 33847619650     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2710752     Document Type: Article

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