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Volumn , Issue , 2006, Pages 2001-2004
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Novel linearization technique for low-distortion high-swing CMOS switches with improved reliability
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
ELECTRIC DISTORTION;
ELECTRIC POTENTIAL;
LINEARIZATION;
NYQUIST DIAGRAMS;
OPTICAL SWITCHES;
RELIABILITY THEORY;
CLOCK-BOOSTING TECHNIQUES;
GATE VOLTAGES;
NYQUIST BANDS;
SAMPLE-AND-HOLD CIRCUITS;
CMOS INTEGRATED CIRCUITS;
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EID: 33847618539
PISSN: 02714310
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (16)
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References (5)
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