Investigation of the cross-tie wall evolution by using magnetic force microscopy and local electrical measurement

Journal of Magnetism and Magnetic Materials

Volumn 310, Issue 2 SUPPL. PART 3, 2007, Pages 2612-2614

  Chang, C C ^a   Chang, Y C ^a   Lo, I C ^a   Wu, J C ^a  

^a NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

Author keywords

Cross tie wall; Magnetoresistance; MFM; Permalloy ellipse

Indexed keywords

FILM GROWTH; MAGNETIC FORCE MICROSCOPY; MAGNETIC PROPERTIES; MAGNETIZATION; MAGNETIZATION REVERSAL; MAGNETORESISTANCE;

CROSS-TIE WALL; MICRON-SIZED PERMALLOYS; PERMALLOY ELLIPSE;

MAGNETIC MATERIALS;

EID: 33847618362     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2006.11.187     Document Type: Article

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