Near infrared reflectance properties of metal oxide nanoparticles

Journal of Physical Chemistry C

Volumn 111, Issue 5, 2007, Pages 1912-1918

  Jeevanandam, P ^a   Mulukutla, R S ^c   Phillips, M ^a   Chaudhuri, S ^a   Erickson, L E ^b   Klabunde, K J ^a  

^a KANSAS STATE UNIVERSITY   (United States)

^b 129 Seaton Hall   (United States)

^c NanoScale Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

KUBELKA-MUNK THEORY; MACROCRYSTALLINE POWDERS; NANOCRYSTALLINE METAL OXIDES;

ABSORPTION SPECTROSCOPY; OPTICAL PROPERTIES; OXIDES; REFLECTION;

NANOSTRUCTURED MATERIALS;

EID: 33847355608     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp066363o     Document Type: Article

References (48)

1. Wake, L. V. J. Oil. Colour Chem. Assoc. 1990, 73, 78.
2. Haines, J. A. U.S. Patent 2,005,215,685, 2005.
3. Shia, M. L.; Kalkanoglu, H. M.; Hong, K. C. U.S. Patent 2,005,-072,114, 2005
4. Verscharen, P. C. M.; Daponte, T. L. F.; Kieser, M.; Edler, G. PCT Int. Appl. 9,626,070, 1996.
5. Kupta, K. K.; Nishkam, A.; Kasturiya, N. J. Ind. Text. 2001, 31, 27.
6. (a) Sliwinski, T. R.; Pipoly, R. A.; Blonski, R. P. U.S. Patent 2.-001,022,151, 2001.
7. (b) Sliwinski, T. R.; Pipoly, R. A.; Blonski, R. P. PCT Int. Appl. 2,000,024,817, 2000.
8. (a) Hiromitsu, Y.; Yoshiyuki, Z.; Hisao, O.; Tohru, H.; Yoshio, A.; Michiei, N. Eur. Pat. Appl. 1,217,044, 2002.
9. (b) H. Yanagimoto et al. US Patent 6,521,038, 2003.
10. Swiler, D. R.; Axtell, E. A. Eur. Pat. Appl. 1,162,175, 2001.
11. Sutter, C. R.; Petelinkar, R. A.; Reeves, R. E. U.S. Patent 6.468.647, 2002.
12. Vanelent, J.; Janssens, M. Eur. Pat. Appl. 1,174,460, 2002.
13. Sasoke, G. E.; Sarver, J. E. U.S. Patent 6,171,383, 2001.
14. Modly, Z. M. U.S. Patent 4,624,710, 1986.
15. Berdahl, P. J. Heat Transfer 1995, 117, 355.
16. Vladimirov, V. M.; Mikhailov, M. M. J. Adv. Mater. 2001, 5, 15.
17. Swiller, D. R. Eur. Pat. Appl. 1,170,258, 2002.
18. Fridolin, B. U.S. Patent 2,005,070,640, 2005.
19. Shiro, Y.; Shojiro, H.; Shoza, O.; Yoshio, A.; Yoshiyuki, Z.; Hiroaki, S. Eur. Pat. Appl. 211,272, 1987.
20. (a) Nanoscale Materials in Chemistry; Klabunde, K. J., Ed.; Wiley: New York, 2001.
21. (b). Yoffe, A. D. Adv. Phys. 1993, 42, 173.
22. Gan, L. M.; Liu, B.; Chew, C. H.; Xu, S. J.; Chua, S. J.; Loy, G. L.; Xu, G. Q. Langmuir 1997, 13, 6427.
23. Klabunde, K. J.; Stark, J. V.; Koper, O.; Mohs, C.; Park, D. G.; Decker, S.; Jiang, Y.; Lagadic, I.; Zhang, D. J. Phys. Chem. 1996, 100, 12142.
24. Wang, D.; Salgueirino-Maceiva, V.; Liz-Marzan, L. M.; Caruso, F. Adv. Mater. 2002, 14, 908.
25. Bockstaller, M. R.; Thomas, E. L. J. Phys. Chem. B. 2003, 107, 10017.
26. Sun, Y.; Riggs, J. E.; Rollins, H. W.; Guduru, R. J. Phys. Chem. B. 1999, 103, 77.
27. Krogman, K. C.; Druffel, T.; Sunkara, M. K. Nanotechnology 2005, 16, 338.
28. Fernandez, F.; Colon, C.; Duran, A.; Barajas, R.; D'Ors, A.; Becerril, M.; Llopis, J.; Paje, S. E.; Saez-Puche, R.; Julian, I. J. Alloys. Comp. 1998, 275-277, 750.
29. Song, J. E.; Kang, Y. S. Mat. Res. Soc. Symp. Proc. 2004, 818, 107.
30. Fangli, Y.; Peng, H.; Chunlei, Y.; Shulan, H.; Jinlin, L. J. Mater. Chem. 2003, 13, 634.
31. Mennig, M.; Oliveira, P. W.; Schmidt, H. Mater. Res. Soc. Symp. Proc. 1999, 576, 415.
32. Mastai, Y.; Diamant, Y.; Aruna, S. T.; Zaban, A. Langmuir 2001, 17, 7118.
33. Allen, T. Particle Size Measurement; Chapman and Hall: London, 1992.
34. Klug, P.; Alexander, L. E. X-ray Diffraction Procedures; Wiley: New York, 1962; p 125.
35. Gregg, S. J.; Sing, K. S. W. Adsorption, Surface Area and Porosity; Academic Press: New York, 1982; p 85.
36. Berntsson, O.; Burger, T.; Folestad, S.; Danielsson, L. G.; Kuhn, J.; Fricke, J. Anal. Chem. 1999, 71, 617.
37. (a). Ben-Dor, E.; Goldshleger, N.; Benyamini, Y.; Agassi, M.; Blumberg, D. G. Soil. Sci. Soc. Am. J. 2003, 67, 289.
38. (b) Du, X.; Dong, L.; Li, C.; Liang, Y.; Chen, Y. Langmuir, 1999, 15, 1693.
39. (a) Körtum, G. Reflectance Spectroscopy: Principles, Methods and Applications; Springer-Verlag: New York, 1969.
40. (b) Lagorio, M. G. J. Chem. Educ. 2004, 81, 1607.
41. (c) Bohren, C. F.; Huffman, D. R. Absorption and Scattering of Light by Small Particles; Wiley: New York, 1983.
42. Jung, K. T.; Shul, Y. G. Chem. Mater. 1997, 9, 420.
43. (a) Rocquefelte, X.; Goubin, F.; Koo, H.; Whangbo, M. H.; Jobic, S. Inorg. Chem. 2004, 43, 2246.
44. (b) Refractive index is defined as the ratio of velocity of light in vacuum to that in a medium. It is one of the parameters that govern the intensity of scattered light. For two materials with similar particle size, the material with a higher refractive indices can be measured using (i) a refractometer, (ii) the Becke line method, (iii) ellipsometry, (iv) a Brewster angle technique, etc. We were not able to measure the refractive indices for our samples because these techniques require samples in the form of thin films, highly polished discs or prisms. The Becke line method or the refractometer method can not be applied for our samples because both of these methods cannot cover a wide range; in the present study, the literature reported refractive indices can vary from 1.5 to 2.7.
45. Richards, R.; Li, W.; Decker, S.; Davidson, C.; Koper, O.; Zaikovski, V.; Volodin, A.; Rieker, T.; Klabunde, K. J. J. Am. Chem. Soc. 2000, 122, 4921.
46. Pasikatan, M. C.; Steele, J. L.; Spillman, C. K.; Haque, E. J. Near Infrared Spectrosc. 2001, 9, 153.
47. Higgins, J. P.; Arrivo, S. M.; Thurau, G.; Green, R. L.; Bowen, W.; Lange, A.; Templeton, A. C.; Thomas, D. L.; Reed, R. A. Anal. Chem. 2003, 75, 1777.
48. Palik, E. D. Handbook of Optical Constants of Solids; Academic Press: NewYork, 1985; Vol. 1.