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Volumn 2005, Issue , 2005, Pages 49-52

A 3.2 W coplanar single-device X-Band amplifier with GaAs HBT

Author keywords

Heterojunction bipolar transistors; MMIC power amplifiers

Indexed keywords

BAND STRUCTURE; ELECTRIC BREAKDOWN; ELECTRIC POTENTIAL; EMITTER COUPLED LOGIC CIRCUITS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; POWER AMPLIFIERS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICES; TUNGSTEN;

EID: 33847312394     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (4)
  • 2
    • 0035416652 scopus 로고    scopus 로고
    • Degradation properties of MOVPE-grown GaInP/GaAs HBTs under combined temperature and current stressing
    • August
    • J. Würfl, P. Kurpas, F. Brunner, M. Mai, M. Rudolph, M. Weyers, "Degradation properties of MOVPE-grown GaInP/GaAs HBTs under combined temperature and current stressing," Microelectron. Reliab., vol. 41, no. 8, pp. 1103-1108, August 2001.
    • (2001) Microelectron. Reliab , vol.41 , Issue.8 , pp. 1103-1108
    • Würfl, J.1    Kurpas, P.2    Brunner, F.3    Mai, M.4    Rudolph, M.5    Weyers, M.6
  • 4
    • 0346305118 scopus 로고    scopus 로고
    • Low phase noise MMIC VCOs for Ka-band applications with improved GaInP/GaAs-HBT technology
    • November
    • J. Hilsenbeck, F. Lenk, W. Heinrich, and J. Würfl, "Low phase noise MMIC VCOs for Ka-band applications with improved GaInP/GaAs-HBT technology", 2005 IEEE GaAs IC Symp. Dig.,pp. 223-226, November 2003.
    • (2003) 2005 IEEE GaAs IC Symp. Dig , pp. 223-226
    • Hilsenbeck, J.1    Lenk, F.2    Heinrich, W.3    Würfl, J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.