Noise effects in RTD-fluxgate

Proceedings of IEEE Sensors

Volumn 2005, Issue , 2005, Pages 935-938

  Ando B ^a   Baglio, S ^a   Sacco, V ^a   Bulsara, A ^b   In, V ^b  

^a UNIVERSITY OF CATANIA   (Italy)

^b Naval Command   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FLUXGATE; ONBOARD POWER REQUIREMENTS; READOUT SIGNAL; RESIDENCE TIMES DIFFERENCE (RTD);

ELECTRIC POWER UTILIZATION; MATHEMATICAL MODELS; SPURIOUS SIGNAL NOISE;

SENSORS;

EID: 33847311402     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSENS.2005.1597854     Document Type: Conference Paper

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