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Volumn 1, Issue , 2005, Pages 153-157
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Novel Wafer Level package technology studies for image sensor devices
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Author keywords
[No Author keywords available]
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Indexed keywords
CONSUMER ELECTRONICS;
ELECTRIC LINES;
IMAGE SENSORS;
MICROPROCESSOR CHIPS;
RELIABILITY THEORY;
SILICON WAFERS;
IMAGE SENSOR DEVICES;
JEDEC / JIS STANDARDS;
WAFER LEVEL PACKAGES;
CHIP SCALE PACKAGES;
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EID: 33847309664
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (13)
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References (8)
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