Cause of the memory effect in "nickel" electrodes

Journal of Power Sources

Volumn 165, Issue 2, 2007, Pages 640-645

  Huggins, Robert A ^a  

^a Stanford University   (United States)

Author keywords

HNi2O3; Memory effect; Nickel electrode; Second discharge plateau

Indexed keywords

CAPACITANCE; ELECTRIC BATTERIES; ELECTRIC DISCHARGES; ELECTRIC POTENTIAL; NICKEL; THERMODYNAMICS;

H NI O SYSTEM; MEMORY EFFECT; NICKEL ELECTRODE; SECOND DISCHARGE PLATEAU;

ELECTROCHEMICAL ELECTRODES;

EID: 33847282940     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2006.10.031     Document Type: Article

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