-
1
-
-
0033878985
-
Amplitude Estimation of Sinusoidal Signals: Survey, New Results, and an Application
-
Feb
-
P. Stoica, Hongbin Li, Jian Li, "Amplitude Estimation of Sinusoidal Signals: Survey, New Results, and an Application," IEEE Trans. on Signal Processing, Vol. 48, No. 2, Feb 2000, pp. 338-352.
-
(2000)
IEEE Trans. on Signal Processing
, vol.48
, Issue.2
, pp. 338-352
-
-
Stoica, P.1
Hongbin, L.2
Jian, L.3
-
2
-
-
33847195325
-
-
IEEE Std. 1057-1094 (R2001), IEEE Standards for Digitizing Waveform Recorders.
-
IEEE Std. 1057-1094 (R2001), "IEEE Standards for Digitizing Waveform Recorders."
-
-
-
-
3
-
-
33847175840
-
-
IEEE Std 1241-2000 IEEE Standard for Terminology and Test Methods for Analog to Digital Converters.
-
IEEE Std 1241-2000 "IEEE Standard for Terminology and Test Methods for Analog to Digital Converters."
-
-
-
-
4
-
-
13244277663
-
Likelihood-Based Statistical Estimation From Quantized Data
-
Feb
-
S. B. Vardeman, C.-S. Lee, "Likelihood-Based Statistical Estimation From Quantized Data," IEEE Trans. on Instrumentation and Measurement, Vol. 54, No. 1, Feb. 2005, pp. 409-414.
-
(2005)
IEEE Trans. on Instrumentation and Measurement
, vol.54
, Issue.1
, pp. 409-414
-
-
Vardeman, S.B.1
Lee, C.-S.2
-
5
-
-
27644534860
-
Improved Residual Analysis in ADC Testing
-
Athens, Greece, 29 September-1 October
-
th Workshop on ADC Modelling and Testing, Athens, Greece, 29 September-1 October 2004, pp. 869-874.
-
(2004)
th Workshop on ADC Modelling and Testing
, pp. 869-874
-
-
Kollár, I.1
-
6
-
-
0028446234
-
Histogram Measurement of ADC Nonlinearities Using Sine Waves
-
June
-
J. Blair, "Histogram Measurement of ADC Nonlinearities Using Sine Waves," IEEE Trans. on Instrumentation and Measurement, Vol. 43, No. 3, June 1994, pp.373-383.
-
(1994)
IEEE Trans. on Instrumentation and Measurement
, vol.43
, Issue.3
, pp. 373-383
-
-
Blair, J.1
-
7
-
-
0031200280
-
Fast and Accurate ADC Testing Via an Enhanced Sine Wave Fitting Algorithm
-
June
-
N. Giaquinto, A. Trotta, "Fast and Accurate ADC Testing Via an Enhanced Sine Wave Fitting Algorithm," IEEE Trans. on Instrumentation and Measurement, Vol. 46, No. 4, June 1997, pp. 1020-1025.
-
(1997)
IEEE Trans. on Instrumentation and Measurement
, vol.46
, Issue.4
, pp. 1020-1025
-
-
Giaquinto, N.1
Trotta, A.2
-
8
-
-
4644335849
-
Cramér-Rao Lower Bound for Parametric Estimation of Quantized Sinewaves
-
Como, Italy, 18-20 May
-
st Instrumentation and Measurement Technology Conference IEEE IMTC 2004, Como, Italy, 18-20 May 2004, vol. 3, pp. 1724-1729.
-
(2004)
st Instrumentation and Measurement Technology Conference IEEE IMTC
, vol.3
, pp. 1724-1729
-
-
Moschitta, A.1
Carbone, P.2
-
9
-
-
0034469962
-
Properties of the IEEE Std 1057 Four Parameter Sine Wave Fit Algorithm
-
Dec
-
P. Händel, "Properties of the IEEE Std 1057 Four Parameter Sine Wave Fit Algorithm," IEEE Trans. on Instrumentation and Measurement, Vol. 49, No. 6, Dec. 2000, pp. 1189-1193.
-
(2000)
IEEE Trans. on Instrumentation and Measurement
, vol.49
, Issue.6
, pp. 1189-1193
-
-
Händel, P.1
-
12
-
-
33847243236
-
-
ENV 13005:1999, Guide to the Expression of Uncertainty in Measurement.
-
ENV 13005:1999, Guide to the Expression of Uncertainty in Measurement.
-
-
-
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