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Volumn 1, Issue , 2005, Pages 510-515

Statistical efficiency of sinewave fitting when using non-linear quantizers

Author keywords

Cram r rao lower bound; Integral non linearity; Overloading; Quantization; Sinewave fitting

Indexed keywords

MATHEMATICAL MODELS; NONLINEAR SYSTEMS; PARAMETER ESTIMATION; SAMPLING; SPURIOUS SIGNAL NOISE; STATISTICAL METHODS;

EID: 33847203325     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (10)

References (13)
  • 1
    • 0033878985 scopus 로고    scopus 로고
    • Amplitude Estimation of Sinusoidal Signals: Survey, New Results, and an Application
    • Feb
    • P. Stoica, Hongbin Li, Jian Li, "Amplitude Estimation of Sinusoidal Signals: Survey, New Results, and an Application," IEEE Trans. on Signal Processing, Vol. 48, No. 2, Feb 2000, pp. 338-352.
    • (2000) IEEE Trans. on Signal Processing , vol.48 , Issue.2 , pp. 338-352
    • Stoica, P.1    Hongbin, L.2    Jian, L.3
  • 2
    • 33847195325 scopus 로고    scopus 로고
    • IEEE Std. 1057-1094 (R2001), IEEE Standards for Digitizing Waveform Recorders.
    • IEEE Std. 1057-1094 (R2001), "IEEE Standards for Digitizing Waveform Recorders."
  • 3
    • 33847175840 scopus 로고    scopus 로고
    • IEEE Std 1241-2000 IEEE Standard for Terminology and Test Methods for Analog to Digital Converters.
    • IEEE Std 1241-2000 "IEEE Standard for Terminology and Test Methods for Analog to Digital Converters."
  • 4
    • 13244277663 scopus 로고    scopus 로고
    • Likelihood-Based Statistical Estimation From Quantized Data
    • Feb
    • S. B. Vardeman, C.-S. Lee, "Likelihood-Based Statistical Estimation From Quantized Data," IEEE Trans. on Instrumentation and Measurement, Vol. 54, No. 1, Feb. 2005, pp. 409-414.
    • (2005) IEEE Trans. on Instrumentation and Measurement , vol.54 , Issue.1 , pp. 409-414
    • Vardeman, S.B.1    Lee, C.-S.2
  • 5
    • 27644534860 scopus 로고    scopus 로고
    • Improved Residual Analysis in ADC Testing
    • Athens, Greece, 29 September-1 October
    • th Workshop on ADC Modelling and Testing, Athens, Greece, 29 September-1 October 2004, pp. 869-874.
    • (2004) th Workshop on ADC Modelling and Testing , pp. 869-874
    • Kollár, I.1
  • 6
    • 0028446234 scopus 로고
    • Histogram Measurement of ADC Nonlinearities Using Sine Waves
    • June
    • J. Blair, "Histogram Measurement of ADC Nonlinearities Using Sine Waves," IEEE Trans. on Instrumentation and Measurement, Vol. 43, No. 3, June 1994, pp.373-383.
    • (1994) IEEE Trans. on Instrumentation and Measurement , vol.43 , Issue.3 , pp. 373-383
    • Blair, J.1
  • 7
    • 0031200280 scopus 로고    scopus 로고
    • Fast and Accurate ADC Testing Via an Enhanced Sine Wave Fitting Algorithm
    • June
    • N. Giaquinto, A. Trotta, "Fast and Accurate ADC Testing Via an Enhanced Sine Wave Fitting Algorithm," IEEE Trans. on Instrumentation and Measurement, Vol. 46, No. 4, June 1997, pp. 1020-1025.
    • (1997) IEEE Trans. on Instrumentation and Measurement , vol.46 , Issue.4 , pp. 1020-1025
    • Giaquinto, N.1    Trotta, A.2
  • 9
    • 0034469962 scopus 로고    scopus 로고
    • Properties of the IEEE Std 1057 Four Parameter Sine Wave Fit Algorithm
    • Dec
    • P. Händel, "Properties of the IEEE Std 1057 Four Parameter Sine Wave Fit Algorithm," IEEE Trans. on Instrumentation and Measurement, Vol. 49, No. 6, Dec. 2000, pp. 1189-1193.
    • (2000) IEEE Trans. on Instrumentation and Measurement , vol.49 , Issue.6 , pp. 1189-1193
    • Händel, P.1
  • 12
    • 33847243236 scopus 로고    scopus 로고
    • ENV 13005:1999, Guide to the Expression of Uncertainty in Measurement.
    • ENV 13005:1999, Guide to the Expression of Uncertainty in Measurement.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.