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Volumn 2, Issue , 2005, Pages 1161-1164

Capacitively-tuned split microstrip resonators for RFID barcodes

Author keywords

Microstrip antennas; Microstrip resonators; Radar cross section; Radio frequency identification; Radio tracking; Smart cards; Ultra wide band

Indexed keywords

BAR CODES; BROADBAND NETWORKS; ELECTRONIC DOCUMENT IDENTIFICATION SYSTEMS; MICROSTRIP ANTENNAS; PHOTOLITHOGRAPHY; RADAR CROSS SECTION; RADAR TRACKING; SMART CARDS; TUNING;

EID: 33847167607     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMC.2005.1610138     Document Type: Conference Paper
Times cited : (115)

References (11)
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  • 3
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    • B. Straaner, Kai Chang, "Passive 5.8-GHz Radio-Frequency Identification Tag for Monitoring Oil Drill Pipe," IEEE Trans. MTT, vol. 51, no. 2, pp. 356-363, Feb. 2003.
    • (2003) IEEE Trans. MTT , vol.51 , Issue.2 , pp. 356-363
    • Straaner, B.1    Chang, K.2
  • 5
    • 0034548284 scopus 로고    scopus 로고
    • An Intelligent 2.4GHz Beam-Scanning X-Array for Moderm RFID Reader
    • May
    • P. Salonen, M. Keskilammi, L. Sydanheimo, M. Kivikoski, "An Intelligent 2.4GHz Beam-Scanning X-Array for Moderm RFID Reader," IEEE AP-S, pp. 190-193, May 2000.
    • (2000) IEEE AP-S , pp. 190-193
    • Salonen, P.1    Keskilammi, M.2    Sydanheimo, L.3    Kivikoski, M.4
  • 7
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    • An Active Tagging System using Circular Polarization Modulation
    • June
    • M. Kossel, H. Benedickter, W. Baechtold, "An Active Tagging System using Circular Polarization Modulation," IEEE MTT-S Digest, pp. 1595-1598, June 1999.
    • (1999) IEEE MTT-S Digest , pp. 1595-1598
    • Kossel, M.1    Benedickter, H.2    Baechtold, W.3
  • 8
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    • Backscttering Characteristics of finite Narrow Rectangular Loop
    • Soc. Int. Symp, pp
    • T. M. Au, Y. W. M. Chia, M-S. Leong, "Backscttering Characteristics of finite Narrow Rectangular Loop", IEEE Ant. & Prop. Soc. Int. Symp., pp. 294-7, 1997.
    • (1997) IEEE Ant. & Prop , pp. 294-297
    • Au, T.M.1    Chia, Y.W.M.2    Leong, M.-S.3
  • 9
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    • J. Watson et. el., Characterisation of Offset Lithographic Films Using Microelectronic Test Structures , IEICE Trans. Electron., E82-C, vo.4, pp. 576-581, April 1999.
    • J. Watson et. el., "Characterisation of Offset Lithographic Films Using Microelectronic Test Structures ", IEICE Trans. Electron., vol.E82-C, vo.4, pp. 576-581, April 1999.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.