DSP based portable impedance measurement instrument using sine-fitting algorithms

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 2005, Pages 1018-1022

  Radil, Tomáš ^a   Ramos, Pedro M ^b   Cruz Serra, A ^b  

^a CZECH TECHNICAL UNIVERSITY IN PRAGUE   (Czech Republic)

^b INSTITUTO SUPERIOR TÉCNICO   (Portugal)

Author keywords

DSP based instrumentation; Impedance measurement; Least squares algorithms; Sine fitting algorithms

Indexed keywords

DSP BASED INSTRUMENTATION; LEAST SQUARES ALGORITHMS; SINE FITTING ALGORITHMS;

ALGORITHMS; ANALOG TO DIGITAL CONVERSION; DIGITAL SIGNAL PROCESSING; ELECTRIC IMPEDANCE MEASUREMENT; PHASE MEASUREMENT; WAVEFORM ANALYSIS;

POTENTIOMETERS (ELECTRIC MEASURING INSTRUMENTS);

EID: 33847159640     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2003.1207906     Document Type: Conference Paper

References (8)

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8. P. M. Ramos, M. Fonseca da Silva and A. Cruz Serra, "Improving sine-fitting algorithms for amplitude and phase measurements", XVII IMEKO World Congress, Dubrovnik, Croatia, pp. 614-619, June 22-27, 2003.