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Volumn 2005, Issue , 2005, Pages 786-789

Dynamic-effect compensating technique for stable a-Si:H AMOLED displays

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ERROR ANALYSIS; HYDROGENATION; LIGHT EMITTING DIODES; OPTICAL RESOLVING POWER;

EID: 33847156006     PISSN: 15483746     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSCAS.2005.1594218     Document Type: Conference Paper
Times cited : (4)

References (10)
  • 2
    • 36549092941 scopus 로고
    • Time and temperature dependence of instability mechanisms in amorphous silicon thin-film transistors
    • Jan
    • M.J. Powell, C. Berkel, and J.R. Hughes, "Time and temperature dependence of instability mechanisms in amorphous silicon thin-film transistors," J. of Applied Physics Letters, vol. 54, pp. 1323-1325, Jan. 1989.
    • (1989) J. of Applied Physics Letters , vol.54 , pp. 1323-1325
    • Powell, M.J.1    Berkel, C.2    Hughes, J.R.3
  • 3
    • 1942431627 scopus 로고    scopus 로고
    • TFT AMOLED Pixel Circuits and Driving Methods
    • Baltimore, May
    • James L. Sanford and Frank R. Libsoh, "TFT AMOLED Pixel Circuits and Driving Methods," in SID Int. Symposium, Baltimore, May 2003, pp. 10-13.
    • (2003) SID Int. Symposium , pp. 10-13
    • Sanford, J.L.1    Libsoh, F.R.2
  • 4
    • 0033583208 scopus 로고    scopus 로고
    • H. Aziz, Z. D. Popovic, N. Hu, A. H, and G. Xu, Degradation mechanism of small molecule-based organic light-emitting devices, Science, 283, pp. 1900-1902, Mar. 1999.
    • H. Aziz, Z. D. Popovic, N. Hu, A. H, and G. Xu, "Degradation mechanism of small molecule-based organic light-emitting devices," Science, vol. 283, pp. 1900-1902, Mar. 1999.
  • 5
    • 0042027167 scopus 로고    scopus 로고
    • Voltage shift phenomena introduced by reverse-bias application in multilayer organic light emitting diodes
    • Feb
    • D. Zoua and T. Tsutsui, "Voltage shift phenomena introduced by reverse-bias application in multilayer organic light emitting diodes," J. of Applied Physics, vol. 87, no. 4, pp. 1951-1956, Feb. 2000.
    • (2000) J. of Applied Physics , vol.87 , Issue.4 , pp. 1951-1956
    • Zoua, D.1    Tsutsui, T.2
  • 6
    • 0035397490 scopus 로고    scopus 로고
    • Improved a-Si:H TFT circuits for active-matrix organic light emitting displays
    • July
    • Y. He, R. Hattori, and J. Kanicki, "Improved a-Si:H TFT circuits for active-matrix organic light emitting displays," IEEE Trans. Electron Devices, vol. 48, no.7 pp. 1322-1325, July 2001.
    • (2001) IEEE Trans. Electron Devices , vol.48 , Issue.7 , pp. 1322-1325
    • He, Y.1    Hattori, R.2    Kanicki, J.3
  • 7
    • 23944491483 scopus 로고    scopus 로고
    • A 3-TFT current-programmed pixel circuit for active-matrix organic light-emitting diode displays
    • July
    • S. J. Ashtiani, P. Servati, D. Striakhilev, and A. Nathan, "A 3-TFT current-programmed pixel circuit for active-matrix organic light-emitting diode displays," IEEE Trans. Electron Devices, vol. 52, no. 7, pp. 1514-1518, July 2005.
    • (2005) IEEE Trans. Electron Devices , vol.52 , Issue.7 , pp. 1514-1518
    • Ashtiani, S.J.1    Servati, P.2    Striakhilev, D.3    Nathan, A.4
  • 8
    • 0021477881 scopus 로고
    • Switch-induced error voltage on a switched capacitor
    • Aug
    • B. J. Sheu and C. HU, "Switch-induced error voltage on a switched capacitor," IEEE J. of solid-state circuits, vol Sc-19, pp. 519-525, Aug. 1984.
    • (1984) IEEE J. of solid-state circuits , vol.Sc-19 , pp. 519-525
    • Sheu, B.J.1    HU, C.2
  • 10
    • 0036564669 scopus 로고    scopus 로고
    • Modeling of the Reverse Characteristics of a-Si:H TFTs
    • May
    • P. Servati and A. Nathan, "Modeling of the Reverse Characteristics of a-Si:H TFTs", IEEE Tran. On Electron Devices, vol. 49, no. 5, pp. 812-819, May 2002.
    • (2002) IEEE Tran. On Electron Devices , vol.49 , Issue.5 , pp. 812-819
    • Servati, P.1    Nathan, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.