Atom probe tomography studies of rf materials

Proceedings of the IEEE Particle Accelerator Conference

Volumn 2005, Issue , 2005, Pages 612-614

  Norem, J ^a   Bauer, P ^b   Sebastian, J ^c   Seidman, D N ^c  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b FERMI NATIONAL ACCELERATOR LABORATORY   (United States)

^c NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BONDING; COATINGS; INTERDIFFUSION (SOLIDS); SURFACE CHEMISTRY; SURFACE TREATMENT; TOMOGRAPHY;

ATOM PROBE TOMOGRAPHY; DARK CURRENTS; EVAPORATIVE COATINGS; FIELD EMISSION;

SUPERCONDUCTING MATERIALS;

EID: 33847141848     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PAC.2005.1590506     Document Type: Conference Paper

References (7)

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3. M. K. Miller, Atom Probe Tomography, Analysis at the Atomic Level, Kluwer Academic / Plenum Publishers New York, (2000)
4. Imago Scientific Instruments, Madison WI, USA.
5. T. Kelly, et al., Microsc. and Microanal., 10, 373, (2004)
6. http://arc.nucapt.northwestern.edu.
7. http://www.mantisdeposition.com/