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Volumn 55, Issue 3, 2006, Pages 245-255

Mapping quantitative trait loci for ordinal traits using the generalized linear model in half-sib designs

Author keywords

Generalized linear model; Maximum likelihood; Ordinal traits; QTL mapping; Threshold models

Indexed keywords


EID: 33847136726     PISSN: 16273583     EISSN: 16273591     Source Type: Journal    
DOI: 10.1051/animres:2006008     Document Type: Article
Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.