Evolution of IEEE 1149.1 Addressable Shadow Protocol Devices

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 981-987

  Joshi, Rakesh N ^a   Williams, Kenneth L ^a   Whetsel, Lee ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; NETWORK PROTOCOLS; STANDARDS; SYNCHRONIZATION;

TEST BUSES;

INTEGRATED CIRCUITS;

EID: 0142215944     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. IEEE Std 1149.1-1990, "IEEE Standard Test Access Port and Boundary Scan Architecture".
2. Data Sheet, National Semiconductor Scan Bridge Device
3. Data Sheet, Texas Instruments Addressable Scan Port Device
4. Whetsel, "A Proposed Method of Accessing 1149.1 in a Backplane Environment", 1992 IEEE International Test Conference, paper 8.1.
5. Whetsel, "Hierarchically Accessing 1149.1 in a System Environment", 1993 IEEE International Test Conference, paper 23.1.
6. Data Sheet, Texas Instruments Linking Addressable Scan Port Device