Power amplifier characterization: An active load-pull system based on six-port reflectometer using complex modulated carrier

35th European Microwave Conference 2005 - Conference Proceedings

Volumn 1, Issue , 2005, Pages 613-616

  Bensmida, S ^a   Bergeault, E ^a   Abib, G I ^a   Huyart, B ^a  

^a TELECOM PARISTECH   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC LOADS; ELECTRIC NETWORK ANALYZERS; ELECTRIC VARIABLES MEASUREMENT; OPTIMIZATION; REFLECTOMETERS; TRANSISTORS;

COMPLEX MODULATED CARRIERS; MEASUREMENT SYSTEMS; POWER ADDED EFFICIENCY (PAE);

POWER AMPLIFIERS;

EID: 33847111747     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMC.2005.1608931     Document Type: Conference Paper

References (7)

1. ième Journées Nationales Microones, Lille May 2003.
2. D.J. Williams, J. Leckey, P.J. Tasker, "Envelope domain analysis of measured time domain voltage and current waveforms provide for improved understanding of factors effecting linearity", Microwave Symposium Digest, 2003 IEEE MTT-S International .Volume: 2 , 8-13 June 2003 Pages:1411 -1414 vol.2.
3. N. Le Gallou, J.M. Nebus, E. Ngoya, H. Buret "Analysis of low frequency memory and influence on solid state HPA intermodulation characteristics", Microwave Symposium Digest, 2001 IEEE MTT-S International, Volume: 2, 20-25 May2001.Pages:979-982, vol.2.
4. rd European Microwave Conference 2003, Munich.
5. J.F Sevic, K.L Burger, M.B Steer "A novel envelope-termination load-pull method for ACPR optimization of RF/microwave power amplifiers", Microwave Symposium Digest, 1998 IEEE MTT-S International, Volume: 2, 7-12 June 1998. Pages:723 - 726.
6. N.B De Carvalho, J.C Pedro "Large- and small-signal IMD behavior of microwave power amplifiers", Microwave Theory and Techniques, IEEE Transactions on , Volume: 47 , Issue: 12 , Dec. 1999 Pages:2364 - 2374.
7. C. Fager, J.C Pedro, N.B De Carvalho, H. Zirath "Prediction of IMD in LDMOS transistor amplifiers using a new large-signal model", Microwave Theory and Techniques, IEEE Transactions on, Volume: 50, Issue: 12, Dec. 2002. Pages: 2834 - 2842.